Ellipsometer Woollam V-VASE

FOM Name:  Ellipsometer V VASE
Model Number:  J. A. Woollam V-VASE

Contact: Anna Kiyanova (anna.kiyanova@wisc.edu, 608-263-1735)
Center:  SMCL
Location: B46 Engineering Hall.

J.A.Woollam V-VASE ellipsometer is a wide spectral range (UV-Vis-NIR) variable angle spectroscopic research-grade ellipsometer that allows various measurement capabilities including reflection and transmission ellipsometry, generalized ellipsometry of anisotropic materials, UV-Vis-NIR reflection and transmission spectroscopy, Mueller matrix measurements. Additional AutoRetarder optics eliminates poor sensitivity for specific Delta and Psi values.

This is an accordion element with a series of buttons that open and close related content panels.


  • Optical configuration: RAE (rotating analyzer ellipsometer) with AutoRetarder
  • Spectral range: 190 – 2500 nm
  • Angles of incidence: 15° – 90°
  • Max sample size: 200 mm x 200 mm, 20 mm thickness
  • Sample plane: vertical
  • Data acquisition rate: 0.1 – 3 s per wavelength
  • Accessory: HTC-100 heat stage, room temperature – 300 °C, 70° angle of incidence, passive cooling, 50 mm sample size