FEI Titan 80-200 Aberration Corrected (S)TEM/EDS/EELS

FOM Name:  TEM Titan
Manufacturer/Model: FEI Titan 80-200
Contact:  Alex Kvit (kvit@wisc.edu, 608-265-4458)
Center:  NIAC
Location:  MSE Room 112

The Titan microscope is a image-aberration-corrected scanning transmission electron microscope (STEM/TEM) capable of producing images with .08nm resolution. The Titan 80-200 microscope equipped with a high-brightness Schottky-field emission electron source, a CEOS probe-side aberration corrector, a high-resolution Gatan Imaging Filter and an EDS detector. The instrument is capable of imaging single atoms, and performing nanoscale chemical and structural analysis. Additionally, the system can perform <0.08 nm spatial resolution Z contrast STEM imaging and <0.1 nm spatial resolution HRTEM imaging.  The microscope has two 2048×2048 slow-scan CCD cameras; one is bottom mounted and one is the GIF camera.

The Titan is equipped for 4D STEM with a high-speed Direct Electron Celeritas camera capable of operation up to 98,000 frames per second. This system provides capability for strain and orientation mapping and in situ 4D STEM of phase transformations and other materials behavior.”

Applications range from determining interface structures with sub-Ångstrom resolution and chemistry with single-atom precision to imaging and analyzing nanoparticles in a multiple-target biomacromolecule labeling system.