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Centers Brochures

NIAC Technique Brochures 

  • Atomic Force Microscopy (AFM)
  • Atom Probe Tomography (APT)
  • Confocal Microscopy
  • Focused Ion Beam/Field Emission Scanning Electron Microscopy (FIB/SEM)
  • Electron Backscattered Diffraction (EBSD)
  • Energy Dispersive X-ray Spectroscopy (EDS)
  • Electron Energy Loss Spectroscopy (EELS)
  • Glow Discharge Optical Emission Spectroscopy (GDOES)
  • Nanoindentation
  • Small Angle X-ray Spectroscopy(SAXS)
  • Scanning Electron Microscopy (SEM)
  • Transmission Electron Microscopy (TEM)
  • X-ray Photoelectron Spectroscopy (XPS)
  • X-ray Diffraction (XRD)
  • X-ray Reflectivity (XRR)

NFC Technique Brochures

  • Additive Processes
  • Metrology Processes
  • Packaging and Assembly Processes
  • Patterning Processes
  • Subtractive Processes
  • Thermal Processes

SMCL Technique Brochures

  • Contact Angle
  • Differential Scanning Calorimetry (DSC)
  • Dynamic Mechanical Analysis (DMA)
  • Ellipsometry
  • Fourier Transform Infrared Spectroscopy (FTIR)
  • Gel Permeation Chromat0graphy (GPC)
  • Quartz Crystal Microbalance (QCM)
  • Raman Spectroscopy
  • Rheometry
  • Thermogravametric Analysis (TGA)
  • Ultraviolet/Visible Spectroscopy (UV/VIS)
  • Tensiometry