Structure Analysis

Structure analysis techniques are used to analyze structural properties of materials, such as, grain size, grain orientation and film thickness and density.  The Wisconsin Centers for Nanoscale Technology has a host of techniques that provide information on structural properties.

Click the links below for more information.

Electron Backscatter Diffraction

Small Angle X-ray

TEM Orientation Imaging

X-Ray Diffraction

X-Ray Reflectivity