Microscopy and Analysis

• Atomic force microscopy (AFM)
• Confocal microscopy
• Focused ion beam/Scanning electron microscopy (DBFIB)
• Nanoindentation
• Scanning Electron Microscopy (SEM)
• Small angle X-ray scattering (SAXS)
• Thermogravimetric Analysis (TGA)
• Thickness interferometry
• Transmission Electron Microscopy (TEM)
• UV-Visible Spectroscopy (UV-VIS)
• X-ray diffraction (XRD)
• X-ray Photoelectron Spectroscopy (XPS)
• X-ray reflectivity (XRR)

Nanofabrication

• Additive processes
• Metrology
• Packaging & Assembly
• Patterning processes
• Subtractive processes
• Thermal processes

Analysis

• Differential scanning calorimetry (DSC)
• Dynamic mechanical analysis (DMA)
• Electron backscattered diffraction (EBSD)
• Electron Energy Loss Spectroscopy (EELS)
• Energy Dispersive X-ray analysis (EDS)
• Fourier Transform Infrared Spectroscopy (FTIR)
• Gel Permeation Chromatography (GPC)
• Glow Discharge Optical Emission Spectroscopy (GDOES)
• Raman Spectroscopy
• Rheometry
• Dynamic Secondary Ion Mass Spectrometry (D-SIMS)