FOM Name: AFM Bruker Icon
Model Number: Bruker Dimension Icon AFM
Contact: Julie Morasch (email@example.com, 608-262-3613)
Location: MSE Room 172
Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.
The Icon AFM in the NIAC allows has Peak Force Tapping, the Quantitative Nanomechanical Analysis software and the Fast Tapping as available options.
This is an accordion element with a series of buttons that open and close related content panels.
X-Y Scan Range 90 µm, open-loop or closed-loop operation
X-Y Position noise (closed-loop) <0.15 nm RMS
X-Y Position noise (open-loop) <0.10 nm RMS
Z Sensor noise 35pm
210 mm vacuum chuck for sample, <15mm thick
XY Sample Stage
Motorized stage with 180 mm x 150 mm inspectable area