FOM Name: AFM Bruker Icon
Model Number: Bruker Dimension Icon AFM
Contact: Frank Flack (fsflack@wisc.edu)
Center: NIAC
Location: MSE Room 172
The Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.
The Icon AFM in the NIAC allows has Peak Force Tapping, the Quantitative Nanomechanical Analysis software and the Fast Tapping as available options.
Bruker AFM website
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Configuration
AFM Specifications
X-Y Scan Range 90 µm, open-loop or closed-loop operation
X-Y Position noise (closed-loop) <0.15 nm RMS
X-Y Position noise (open-loop) <0.10 nm RMS
Z Sensor noise 35pm
Sample Size/holder
210 mm vacuum chuck for sample, <15mm thick
XY Sample Stage
Motorized stage with 180 mm x 150 mm inspectable area
Bruker AFM Probes: TESPA and Scanasyst air probes are available for purchase from NIAC staff
