Bruker MultiMode 8 Atomic Force Microscope

FOM Name:  AFM Bruker MultiMode 8
Model:  Bruker MultiMode 8
Contact: John Jacobs (jacobs@engr.wisc.edu, 608-262-3787)
Center:  NIAC
Location:  MSE Room 172

The Bruker Multimode 8 AFM is a high resolution, low noise AFM.  Typical applications are roughness measurements, evaluation of step heights and imaging with nanoscale resolution.  Imaging modes include contact mode, tapping mode and peak force tapping.

 

This is an accordion element with a series of buttons that open and close related content panels.

Configuration

X-Y Scan Range: 15 µm (E scanner), 100 µm (J scanner)

Z Scan Range: 5 µm, open-loop operation

Max. sample size: 15 mm diameter

Imaging Noise: <0.3 Å  RMS