FOM Name: TEM Titan
Manufacturer/Model: FEI Titan 80-200
Contact: Alex Kvit (kvit@wisc.edu, 608-265-4458)
Center: NIAC
Location: MSE Room 112
The Titan microscope is a image-aberration-corrected scanning transmission electron microscope (STEM/TEM) capable of producing images with .08nm resolution. The Titan 80-200 microscope equipped with a high-brightness Schottky-field emission electron source, a CEOS probe-side aberration corrector, a high-resolution Gatan Imaging Filter and an EDS detector. The instrument is capable of imaging single atoms, and performing nanoscale chemical and structural analysis. Additionally, the system can perform <0.08 nm spatial resolution Z contrast STEM imaging and <0.1 nm spatial resolution HRTEM imaging. The microscope has two 2048×2048 slow-scan CCD cameras; one is bottom mounted and one is the GIF camera.
Applications range from determining interface structures with sub-Ångstrom resolution and chemistry with single-atom precision to imaging and analyzing nanoparticles in a multiple-target biomacromolecule labeling system.
This is an accordion element with a series of buttons that open and close related content panels.
Configuration
- Emitter: Schottky field-emission electron gun
- Acceleration voltage 200 & 80 kV
- Point resolution = 0.239 nm at 200kV
- Line resolution = 0.122 nm
- Information limit 0.07 nm
- EDS, EDAX, 128 eV resolution
- Eucentric goniometer (± 45º and ± 30º)
- Orius 2.6k x 4k fast CCD
- HR GIF Tridiem
- 2k x 2k Gatan Ultrascan CCDs
- EELS resolution 0.55 eV (TEM) & 0.7 e (STEM)
- STEM mode, resolution 0.08 nm
- Very low contamination
- Superior drift <1 A/min
