FOM Name: XRD Bruker D8 Discovery
Model: Bruker D8 Discovery
Contact: Don Savage (dsavage@wisc.edu, 608-263-0831)
Center: NIAC
Location: ERB Rm 832
The Bruker D8 Discovery x-ray diffractometer is ideally suited for rapid phase identification, stress analysis, and texture determination. It also has mapping capabilities of ~0.1 mm lateral resolution and can be configured for small angle x-ray scattering (SAX). In addition, the source and detector are mounted are in a theta-theta geometry allowing for easy measurement of powders.
This is an accordion element with a series of buttons that open and close related content panels.
Configuration
Source: Cu-Ka micro x-ray source with Montel mirror
- Less than 0.1 degrees divergence
- Spot diameter as low as 0.1 mm
Detector: Vantec 500 area detector
- 14 cm diameter active area
- 2048 by 2048 pixels
- pixel size is 68 mm by 68 mm
Sample stage:
- x, y, z., Chi, and Phi motion
- x and y range of 40mm
