FOM Name: TEM Tecnai TF 30
Model: FEI Tecnai TF-30
Contact: Alex Kvit (kvit@wisc.edu, 608-265-4458)
Center: NIAC
Location: MSE Room 118
The FEI Tecnai TF-30 300KV TEM is equipped with high angle tomography and double-tilt holders and has the ability to perform energy filtered TEM (EFTEM) and high angle annular dark field (HAADF) analysis. Additionally, the TF-30 is equipped with the Gatan K2 direct electron detector which significantly improves both contrast and resolution.
The TF-30 is also equipped with the NanoMEGAS ASTAR TEM precession orientation imaging system enabling orientation-phase imaging with 1nm resolution. Additionally, the TF-30 has a Gatan K2 direct electron detector.
This is an accordion element with a series of buttons that open and close related content panels.
Configuration
- Emitter: Schottky field-emission electron gun
- Acceleration voltage 300, 200, 80 kV
- Point resolution = 0.236 nm at 300kV
- Line resolution = 0.122 nm
- Information limit 0.132 nm
- Eucentric tomograph goniometer (± 70º and ± 30º)
- Two 2k x 2k Gatan Ultrascan CCDs
- GIF Quantum
- EELS resolution 0.7 eV
- STEM mode, resolution 0.2 nm
- Tomo- holders
- Low –dose experiments
