Acquisition of a Scanning Electron Microscope/Focused Ion Beam Instrument with 3D “Slice and View” Capability

Focused ion beam (FIB) instruments have become the go-to method for creating nanoscale shape in materials, including preparing samples for transmission electron microscopy and atom probe tomography. FIB employs an ion beam to shape and slice samples to precise sizes that enable examination of important and elusive microstructural features. The Materials Science Center (MSC) is […]

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