NIAC Instrumentation
Microscopy
- Bruker Catalyst BioAFM Atomic Force Microscope
- Bruker Icon Atomic Force Microscope
- Bruker MultiMode 8 Atomic Force Microscope
- FEI Helios G4 Plasma FIB/FESEM/EBSD/EDS
- Zeiss Auriga FIB/FESEM/EDS
- Leica optical microscope with phase contrast imaging
- Zeiss LEO 1550VP FESEM/EDS
- Zeiss LEO 1530-1 FESEM/EDS/EBSD
- Zeiss Gemini 450 FESEM
- FEI Tecnai T-12 Cryo TEM
- FEI Tecnai TF 30 TEM
- FEI Titan 80-200 Aberation Corrected (S)TEM/EDS/EELS
- NanoMegas ASTAR TEM Orientation Imaging System
- Zygo New View 9000 Optical Profilometer
X-ray Analysis
Sample Preparation
- Tousimis Critical Point Dryer
- Leica ACE600 Sputter Deposition system
- Denton DV-502A Metal Evaporator
- TEM Dimpler
- FEI Vitrobot Cryo vitrifier
- Fischione 1050 TEM Ion Mill
- Fischione 1040 TEM Ion Mill
- FEI Helios G4 UX Plasma Dual Beam FIB
Spectroscopy
Mechanical Test
FOM Names
- AFM Bruker BioAFM
- AFM Bruker Icon
- NanoMegas
- FIB FEI Helios PFIB G4
- FIB Zeiss Auriga
- GDOES Horiba GD-2
- Indenter Bruker Hysitron PI85 SEM Pico Indenter
- Indenter Bruker Hysitron PI95 TEM Pico Indenter
- Indenter Bruker Hysitron TI-950 Triboindenter
- NanologSpectrofluorometer
- Phase contrast Leica optical microscope **
- Prep Denton DV-502A Evaporator
- Prep Dimpler **
- Prep FEI Vitrobot
- Prep Fischione 1050
- Prep Fischione Ion Mill 1040